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dc.contributor.authorMcLaren, S.A.en_GB
dc.contributor.authorKilen, Isak Ragnvalden_GB
dc.contributor.authorMoloney, J.V.en_GB
dc.date.accessioned2022-12-06T09:14:45Z
dc.date.accessioned2022-12-07T12:20:24Z
dc.date.available2022-12-06T09:14:45Z
dc.date.available2022-12-07T12:20:24Z
dc.date.issued2022-08-02
dc.identifier.citationMcLaren, Kilen, Moloney. Colliding Pulse Mode Locking and Nonequilibrium Carrier Dynamics within Vertical External-Cavity Surface-Emitting Lasers. Physical Review Applied. 2022;18(2):1-13en_GB
dc.identifier.urihttp://hdl.handle.net/20.500.12242/3105
dc.descriptionMcLaren, S.A.; Kilen, Isak Ragnvald; Moloney, J.V.. Colliding Pulse Mode Locking and Nonequilibrium Carrier Dynamics within Vertical External-Cavity Surface-Emitting Lasers. Physical Review Applied 2022 ;Volum 18.(2) s. 1-13en_GB
dc.description.abstractThe complex nonlinear dynamics of colliding counterpropagating ultrashort laser pulses circulating in a vertical external-cavity surface-emitting ring laser cavity are captured by a first-principles quantum-mechanical microscopic model coupled to an intracavity beam propagator. Our numerical simulations establish that overall mode locking stability is sensitive to relative phases and delays of the pulses impinging on the semiconductor saturable absorber mirror. Delay offsets of the counterpropagating pulses lead to asymmetric carrier recovery and instability, often leading in turn to single unidirectional circulating pulses. Although computationally challenging, we also include transverse effects and show that the influence of interference patterns from spatial gratings written by the counterpropagating pulses is significant in stabilizing the modelocked pulses.en_GB
dc.language.isoenen_GB
dc.subjectLasereen_GB
dc.subjectFaststofflaseren_GB
dc.subjectNumerisk analyseen_GB
dc.subjectModelleringen_GB
dc.titleColliding Pulse Mode Locking and Nonequilibrium Carrier Dynamics within Vertical External-Cavity Surface-Emitting Lasersen_GB
dc.date.updated2022-12-06T09:14:45Z
dc.identifier.cristinID2048427
dc.identifier.doi10.1103/PhysRevApplied.18.024006
dc.source.issn2331-7019
dc.type.documentJournal article
dc.relation.journalPhysical Review Applied


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