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dc.contributor.authorLandström, Len_GB
dc.contributor.authorKullander, Fredriken_GB
dc.contributor.authorWästerby, Pären_GB
dc.contributor.authorRøen, Bent Toreen_GB
dc.date.accessioned2019-10-16T08:19:02Z
dc.date.accessioned2020-01-13T11:22:38Z
dc.date.available2019-10-16T08:19:02Z
dc.date.available2020-01-13T11:22:38Z
dc.date.issued2019-05-17
dc.identifier.citationLandström, Kullander F, Wästerby P, Røen BTR. Passive LWIR hyperspectral imaging of surfaces contaminated by CWA droplets. Proceedings of SPIE, the International Society for Optical Engineering. 2019;11010en_GB
dc.identifier.urihttp://hdl.handle.net/20.500.12242/2660
dc.descriptionLandström, L; Kullander, Fredrik; Wästerby, Pär; Røen, Bent Tore. Passive LWIR hyperspectral imaging of surfaces contaminated by CWA droplets. Proceedings of SPIE, the International Society for Optical Engineering 2019 ;Volum 11010.en_GB
dc.description.abstractA passive LWIR camera based on a focal plane array detector was used to capture hyperspectral images of different scenes where low volatile chemical warfare agent (CWA) and simulant droplets were deposited on a variety of substrates. Four different CWA; mustard gas (HD), cyclosarin (GF), VX, VR, and two simulant liquids; dimethyl methylphosphonate (DMMP) and triethyl phosphate (TEP) were used as surface contaminants and applied to the substrates as 5 μl droplets. The trials were performed outdoors with the scene close to the ground and the camera imaging at an angle of approximately 35° and a stand-off distance of about 2 m, i.e., mainly the reflected radiation from the cold sky in combination with the thermal emission from the scene was observed. Brightness temperature spectra were extracted from the hyperspectral data cubes and compared to results from a thin film model as well as reference LWIR spectra of the liquids.en_GB
dc.language.isoenen_GB
dc.subjectTermSet Emneord::Refleksjonen_GB
dc.subjectTermSet Emneord::Væskeren_GB
dc.subjectTermSet Emneord::Aluminiumen_GB
dc.titlePassive LWIR hyperspectral imaging of surfaces contaminated by CWA dropletsen_GB
dc.typeArticleen_GB
dc.date.updated2019-10-16T08:19:01Z
dc.identifier.cristinID1736888
dc.identifier.doi10.1117/12.2520420
dc.source.issn0277-786X
dc.source.issn1996-756X
dc.type.documentJournal article
dc.relation.journalProceedings of SPIE, the International Society for Optical Engineering


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