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dc.contributor.authorHovland, Harald
dc.date.accessioned2017-11-06T07:28:51Z
dc.date.accessioned2017-11-10T10:25:55Z
dc.date.available2017-11-06T07:28:51Z
dc.date.available2017-11-10T10:25:55Z
dc.date.issued2015
dc.identifier.citationHovland H. Spin scan tomographic imager. Proceedings of SPIE, the International Society for Optical Engineering. 2015;9451(January)en_GB
dc.identifier.urihttp://hdl.handle.net/20.500.12242/791
dc.identifier.urihttps://ffi-publikasjoner.archive.knowledgearc.net/handle/20.500.12242/791
dc.descriptionHovland, Harald. Spin scan tomographic imager. Proceedings of SPIE, the International Society for Optical Engineering 2015 ;Volum 9451.(January) s.en_GB
dc.description.abstractA novel imaging device based on tomographic reconstruction is presented. The imager is based on rotating an image of the scene onto a linear detector array, and then reconstructing a 2-dimensional image from the detector array signal using tomographic reconstruction techniques. Similar in many ways to the conical scan tomographic scanning (TOSCA) imager, the spin scan TOSCA imager features several improvements compared to its predecessors, mainly because the linear array covers the whole scene and hence in principle can collect 100% of the incoming photons. In addition to presenting the theory behind the device and its sensitivity to noise, non-uniformity and errors, an experimental uncooled mid-wave infrared imager demonstrator is also presented, together with images of test targets, both the final result as well as the incremental steps in the imaging reconstruction process.en_GB
dc.language.isoenen_GB
dc.subjectTermSet Emneord::Tomografi
dc.subjectTermSet Emneord::Bildebehandling
dc.subjectTermSet Emneord::Infrarødteknikk
dc.titleSpin scan tomographic imageren_GB
dc.typeArticleen_GB
dc.date.updated2017-11-06T07:28:51Z
dc.identifier.cristinID1252262
dc.identifier.cristinID1252262
dc.identifier.doi10.1117/12.2178043
dc.source.issn0277-786X
dc.source.issn1996-756X
dc.type.documentJournal article
dc.relation.journalProceedings of SPIE, the International Society for Optical Engineering


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